Functional level testability analysis for digital circuits
author
Ubar, Raimund-Johannes
Kuchcinski, Ktzysztof
statement of authorship
Raimund Ubar, Krzysztof Kuchcinski
source
ETC '93 : European Test Conference, Rotterdam, The Netherlands, April 19-22, 1993
location of publication
Rotterdam
year of publication
1993
pages
p. 545-546
subject term
digitaalelektroonika
analüüs
notes
Bibl. p. 546
language
inglise