Fault oriented test pattern generation for sequential circuits using Genetic Algorithms
statement of authorship
Eero Ivask, Jaan Raik, Raimund Ubar
location of publication
[Tallinn]
publisher
year of publication
pages
p. 129-132 : ill
subject term
ISBN
9985-59-179-8
notes
Bibliogr.: 13 ref
language
inglise
Ivask, E., Raik, J., Ubar, R. Fault oriented test pattern generation for sequential circuits using Genetic Algorithms // The 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings. [Tallinn] : Tallinn Technical University, 2000. p. 129-132 : ill.