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Volatility of ambient electromagnetic noise in view of measurement of EMI emissions of RES installations in lower than 30 MHz bandwidth

author
Kütt, Lauri
Salum, Taavi
Parker, Martin
Piilberg, Juhan
Keltman, Hendrik
Valgur, Laur
statement of authorship
Lauri Kütt, Taavi Salum, Martin Parker, Juhan Piilberg, Hendrik Keltman, Laur Valgur
source
publisher
year of publication
pages
5 p
conference name, date
66th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), October 23-25, 2025
conference location
Riga, Latvia
url
ISSN
2768-3338
2996-1033
ISBN
979-8-3315-7772-8
979-8-3315-7773-5
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
Kütt, L., Salum, T., Parker, M., Piilberg, J., Keltman, H., Valgur, L. Volatility of ambient electromagnetic noise in view of measurement of EMI emissions of RES installations in lower than 30 MHz bandwidth // 2025 IEEE 66th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON). : IEEE, 2025. 5 p. https://doi.org/10.1109/RTUCON67996.2025.11414870