Numerical simulation of electrothermal effects in ESD protection devices
author
Hellström, Sven
Freidin, Boris
Velmre, Enn
Udal, Andres
statement of authorship
Hellstrom, S., Freydin, B., Velmre, E., Udal, A.
source
ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992, Schwäbisch Gmünd, Germany : conference proceedings
location of publication
Berlin
publisher
VDE-Verlag
year of publication
1992
pages
p. 77-80
conference name, date
ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992
conference location
Schwäbisch Gmünd, Germany
url
https://d-nb.info/921228503/04
subject term
elektroonikaaparatuur
hõõrdeelekter
varjestus
lülitus- ja kaitseseadised
simulatsioon
matemaatiline modelleerimine
TalTech department
elektroonikainstituut
language
inglise