Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement
author
statement of authorship
M.Blyzniuk, I.Kazymyra, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar
source
journal volume number month
Vol. 41
year of publication
pages
p. 2023-2040 : ill
subject term
ISSN
0026-2714
notes
Bibliogr.: 31 ref
language
inglise
Blyzniuk, M., Kazymyra, I., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J. Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement // Microelectronics reliability (2001) Vol. 41, p. 2023-2040 : ill. https://www.sciencedirect.com/science/article/pii/S0026271401000920