The measurement and tuning of SiC diode voltage doubler represented as diffusion-welded stack [Online resource]
author
Toompuu, Jana
Sleptšuk, Natalja
Land, Raul
Korolkov, Oleg
Rang, Toomas
statement of authorship
Jana Toompuu, Natalja Sleptsuk, Raul Land, Oleg Korolkov, Toomas Rang
source
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
publisher
IEEE
year of publication
2018
pages
4 p.: ill
conference name, date
16th Biennial Baltic Electronics Conference (BEC), October 8-10, 2018
conference location
Tallinn, Estonia
url
https://doi.org/10.1109/BEC.2018.8600963
subject term
ränikarbiid
vertikaalne integratsioon
keevitus
keyword
silicon carbide
vertical integration
silicon carbide JBS diodes
diffusion welding
vertical integration
ISSN
1736-3705
ISBN
978-1-5386-7313-3
notes
Bibliogr.: 4 ref
TalTech department
Thomas Johann Seebecki elektroonikainstituut
language
inglise
Reserch Group
Cognitronic lab-on-a-chip research group
Research laboratory for cognitronics
Measurement electronics research group