Yakushev, M.V., Maiello, P., Raadik, T., Krustok, J. et al.

full record print

Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics

author

Yakushev, M.V.

Maiello, P.

Raadik, Taavi

Krustok, Jüri

statement of authorship

M.V. Yakushev, P. Maiello, T. Raadik, ... J. Krustok, ... [et al.]

source

Thin solid films

publisher

Elsevier

journal volume number month

Vol. 562

year of publication

2014

pages

p. 195-199 : ill

url

https://doi.org/10.1016/j.tsf.2014.04.057

ISSN

0040-6090

notes

Bibliogr.: 29 ref

Open Access

scientific publication

teaduspublikatsioon

language

inglise

Märksõnad ja võtmesõnad

subject term

päikeseelemendid

õhukesed kiled

pooljuhtkiled

spektroskoopia

fotoluminestsents

keyword

thin films

solar cells

semiconductors

electronic structure

Raman spectroscopy

photoreflectance

photoluminescence

Teaduspublikatsiooni meetrika

classifier

1.1

Scopus

Journal metrics at Scopus

Article at Scopus

WOS

Journal metrics at WOS

Article at WOS

kvartiil

Kategooriad

category (general)

Materials science

Physics and astronomy

category (sub)

Materials science. Metals and alloys

Materials science. Surfaces, coatings and films

Materials science. Electronic, optical and magnetic materials

Materials science. Materials chemistry

Physics and astronomy. Surfaces and interfaces

TalTechi üksused

TTÜ department

materjaliteaduse instituut

Yakushev, M.V., Maiello, P., Raadik, T., Krustok, J. et al. Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics // Thin solid films (2014) Vol. 562, p. 195-199 : ill. https://doi.org/10.1016/j.tsf.2014.04.057