Design error diagnosis in scan-path designs
author
statement of authorship
Raimund Ubar
source
2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers
location of publication
[S. l.]
year of publication
pages
p. 162-168 : ill
notes
Bibliogr.: 16 ref
Ubar, R.-J. Design error diagnosis in scan-path designs // 2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers. [S. l.], 2001. p. 162-168 : ill.