Method of samples preparation intended for research of deep centers in i-, n-, and p-layers of GaAs p+-pin-n+ structures and result of analysis
statement of authorship
J. Toompuu, N. Sleptsuk, O. Korolkov, T. Rang
location of publication
Tallinn
publisher
year of publication
pages
p. 35-38 : ill
subject term
ISBN
978-1-5090-1392-0
notes
Bibliogr.: 6 ref
TTÜ department
language
inglise
Toompuu, J., Sleptšuk, N., Korolkov, O., Rang, T. Method of samples preparation intended for research of deep centers in i-, n-, and p-layers of GaAs p+-pin-n+ structures and result of analysis // BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2016. p. 35-38 : ill.