Code coverage analysis using high-level decision diagrams [Electronic resource]
                                            statement of authorship
                                    
                                    
Jaan Raik, Uljana Reinsalu, Raimund Ubar, Maksim Jenihhin, Peeter Ellervee
                                                    
                                            
                                            location of publication
                                    
                                    
[S.l.]
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 201-207 : ill. [CD-ROM]
                                                    
                                            
                                            ISBN
                                    
                                    
978-1-4244-2277-7
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 13 ref
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                            Raik, J., Reinsalu, U., Ubar, R.-J., Jenihhin, M., Ellervee, P. Code coverage analysis using high-level decision diagrams [Electronic resource] // 2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 2008. [S.l.] : IEEE, 2008. p. 201-207 : ill. [CD-ROM].