Reliability study of input side capacitors in impedance-source PV microconverters
statement of authorship
Elizaveta Liivik, Dmitri Vinnikov, Andrii Chub, Yanfeng Shen, Huai Wang, Frede Blaabjerg
location of publication
Danvers
publisher
year of publication
pages
p. 5026–5032 : ill
conference name, date
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, 14 - 17 October, 2019
conference location
Lisbon, Portugal
WOS
kvartiil
category (general)
category (sub)
ISSN
2577-1647
ISBN
978-1-7281-4878-6
notes
Bibliogr.: 32 ref
scientific publication
teaduspublikatsioon
classifier
TTÜ department
language
inglise
Uurimisrühm
Liivik, E., Vinnikov, D., Chub, A., Shen, Y. et al. Reliability study of input side capacitors in impedance-source PV microconverters // IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : proceedings. Danvers : IEEE, 2019. p. 5026–5032 : ill. https://doi.org/10.1109/IECON.2019.8927173