Critical path tracing based simulation of transition delay faults
author
Kõusaar, Jaak
Ubar, Raimund-Johannes
Devadze, Sergei
Raik, Jaan
statement of authorship
Jaak Kõusaar, Raimund Ubar, Sergei Devadze, Jaan Raik
source
2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2014
pages
p. 108-113 : ill
conference name, date
17th Euromicro Conference on Digital System Design (DSD 2014), 27-29 August, 2014
conference location
Verona, Italy
subject term
elektronlülitused
rikked
diagnostika (tehnika)
kompuutermodelleerimine
algoritmid
keyword
transition delay faults
non-robust and functional sensitization
critical path fault tracing
7-valued algebra
ISBN
978-1-4799-5793-4
notes
Bibliogr.: 20 ref
TalTech department
arvutitehnika instituut
language
inglise