Back-traced deductive-parallel fault simulation for digital systems
                                            author
                                    
                                    
                                            statement of authorship
                                    
                                    
Vladimir Hahanov, Raimund Ubar, Stanley Hyduke
                                                    
                                            
                                            source
                                    
                                    
Proceedings : Euromicro Symposium on Digital System Design : Belek-Antalya, Turkey, September 1st to 6th, 2003
                                                    
                                            
                                            location of publication
                                    
                                    
Los Alamitos
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 370-377 : ill
                                                    
                                            
                                            conference name, date
                                    
                                    
Euromicro Symposium on Digital System Design DSD’2003, September 1-6, 2003
                                                    
                                            
                                            conference location
                                    
                                    
Belek-Antalya, Turkey
                                                    
                                            
                                            ISBN
                                    
                                    
0-7695-2003-0
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 7 ref
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                                            keyword
                                    
                                    
back traced simulation
                                                    
                                                    
                                                    
re-convergent fan-outs
                                                    
                                                    
fault analysis model
                                                    
                                                    
deductive
                                                    
                                                    
parallel simulation
                                                    
                                            
                            Hahanov, V., Ubar, R.-J., Hyduke, S. Back-traced deductive-parallel fault simulation for digital systems // Proceedings : Euromicro Symposium on Digital System Design : Belek-Antalya, Turkey, September 1st to 6th, 2003. Los Alamitos : IEEE Computer Society, 2003. p. 370-377 : ill.