Improved impedance analyzer with binary excitation signals

heading
Märtens, O., Land, R., Min, M., Annus, P., Rist, M., Reidla, M.
statement of authorship
Olev Martens, Raul Land, Mart Min, Paul Annus, Marek Rist and Marko Reidla
location of publication
[S.l.]
publisher
year of publication
pages
p. 25-29 : ill
conference name, date
9th International Symposium on Intelligent Signal Processing (WISP 2015), 15-17 May, 2015
conference location
Siena, Italy
keyword
DFT
aliases
binary
ISBN
978-1-4799-7252-4
notes
Bibliogr.: 13 ref
availibility
ei leidu TTÜ Raamatukogus
TTÜ department code
ie
country
us
language
inglise
report field
välisp2015
aastar2015i
editor's notes
Pl 210116
Märtens, O., Land, R., Min, M., Annus, P., Rist, M., Reidla, M. Improved impedance analyzer with binary excitation signals // 2015 IEEE 9th International Symposium on Intelligent Signal Processing (WISP 2015) : Siena, Italy, 15-17 May 2015 : [proceedings]. [S.l.] : IEEE, 2015. p. 25-29 : ill.