Experimental evaluation of GaN gate injection transistors

author
Barlik, Roman
statement of authorship
Jacek Rabkowski, Roman Barlik
journal volume number month
Nr. 3
year of publication
pages
p. 9-12 : ill
keyword
Gate Injection Transistor (GIT)
double-pulse test
ISSN
0033-2097
notes
Bibliogr.: 17 ref
Kokkuvõte poola keeles
TTÜ department
language
inglise
Rabkowski, J., Barlik, R. Experimental evaluation of GaN gate injection transistors // Przeglad elektrotechniczny = Electrical review (2015) Nr. 3, p. 9-12 : ill. http://dx.doi.org/10.15199/48.2015.03.03