Jenihhin, M., Kamkin, A., Navabi, Z., Sadeghi-Kohan, S.

Universal mitigation of NBTI-induced aging by design randomization

author

Jenihhin, Maksim

Kamkin, Alexander

Navabi, Zainalabedin

Sadeghi-Kohan, Somayeh

statement of authorship

Maksim Jenihhin, Alexander Kamkin, Zainalabedin Navabi, Somayeh Sadeghi-Kohan

source

Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016

location of publication

[S.l.]

publisher

IEEE

year of publication

2017

pages

[5] p. : ill

conference name, date

2016 IEEE East-West Design and Test Symposium, EWDTS 2016, October 14-17, 2016

conference location

Yerevan, Armenia

url

http://dx.doi.org/10.1109/EWDTS.2016.7807635

subject term

nanoelektroonika

projekteerimine

ISSN

2472-761X

ISBN

978-1-5090-0693-9

notes

Bibliogr.: 28 ref

TTÜ department

arvutisüsteemide instituut

language

inglise

Jenihhin, M., Kamkin, A., Navabi, Z., Sadeghi-Kohan, S. Universal mitigation of NBTI-induced aging by design randomization // Proceedings of 2016 IEEE East-West Design & Test Symposium (EWDTS) : Yerevan, Armenia, October 14-17, 2016. [S.l.] : IEEE, 2017. [5] p. : ill. http://dx.doi.org/10.1109/EWDTS.2016.7807635