Malburg, J., Janson, K., Raik, J., Dannemann, F.

Fault-aware performance assessment approach for embedded networks

author

Malburg, Jan

Janson, Karl

Raik, Jaan

Dannemann, Frank

statement of authorship

Jan Malburg, Karl Janson, Jaan Raik, Frank Dannemann

source

2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings

location of publication

Danvers

publisher

IEEE

year of publication

2019

pages

4 p. : ill

conference name, date

22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 24-26 April 2019

conference location

Cluj-Napoca, Romania

url

https://doi.org/10.1109/DDECS.2019.8724670

subject term

manussüsteemid

mõõtmine

jõudlus (informaatika)

rikked

keyword

embedded networks/NoC

analysis

performance

fault effects

ISSN

2473-2117

ISBN

978-1-7281-0073-9

notes

Bibliogr.: 12 ref

TTÜ department

arvutisüsteemide instituut

language

inglise

Uurimisrühm

Embedded AI research laboratory

Centre of dependable computing systems

Malburg, J., Janson, K., Raik, J., Dannemann, F. Fault-aware performance assessment approach for embedded networks // 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings. Danvers : IEEE, 2019. 4 p. : ill. https://doi.org/10.1109/DDECS.2019.8724670