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Machine learning clustering techniques for selective mitigation of critical design features

author
statement of authorship
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone
source
location of publication
Danvers
publisher
year of publication
pages
7 p. : ill
conference name, date
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), July 13-16, 2020
conference location
Napoli, Italy
url
ISBN
9781728181875
notes
Bibliogr.: 12 ref
TalTech department
language
inglise
subject term
keyword
terms-transient faults
single-event upsets
selective mitigation
selective hardening
soft error protection
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Lange, T., Balakrishnan, A., Glorieux, M. et al. Machine learning clustering techniques for selective mitigation of critical design features // Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition. Danvers : IEEE, 2020. 7 p. : ill. https://doi.org/10.1109/IOLTS50870.2020.9159751