Composing graph theory and deep neural networks to evaluate SEU type soft error effects
statement of authorship
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux, Dan Alexandrescu, Maksim Jenihhin
source
9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 2020
location of publication
Danvers
publisher
year of publication
conference name, date
9th Mediterranean Conference on Embedded Computing (MECO'2020), 8-11 June 2020
conference location
Budva, Montenegro
subject term
keyword
gate-level circuit abstraction
Single Event Transient (SET) and Soft Errors
notes
Bibliogr.: 10 ref
TTÜ department
language
inglise
Balakrishnan, A., Lange, T., Glorieux, M., Alexandrescu, D., Jenihhin, M. Composing graph theory and deep neural networks to evaluate SEU type soft error effects // 9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 2020. Danvers : IEEE, 2020.