print

Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits

author
Pagliarini, Samuel Nascimento
Benites, Luis
Martins, Mayler
Rech, Paolo
Kastensmidt, Fernanda
statement of authorship
Samuel Pagliarini, Luis Benites, Mayler Martins, Paolo Rech, Fernanda Kastensmidt
source
IEEE transactions on nuclear science
publisher
IEEE
journal volume number month
vol. 68, 5
year of publication
2021
pages
p. 1045-1053
url
https://doi.org/10.1109/TNS.2021.3070643
subject term
riistvara
rikked
optimeerimine
integraallülitused
keyword
circuit synthesis
logic synthesis
radiation hardening
redundancy
ISSN
0018-9499
notes
Bibliogr.: 23 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
Journal metrics at Scopus
Article at Scopus
WOS
Journal metrics at WOS
Article at WOS
category (general)
Energy
Physics and astronomy
Engineering
category (sub)
Energy. Nuclear energy and engineering
Physics and astronomy. Nuclear and high energy physics
Engineering. Electrical and electronic engineering
kvartiil
Q2
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for hardware security
Pagliarini, S., Benites, L., Martins, M., Rech, P., Kastensmidt, F. Evaluating architectural, redundancy, and implementation strategies for radiation hardening of FinFET integrated circuits // IEEE transactions on nuclear science (2021) vol. 68, 5, p. 1045-1053. https://doi.org/10.1109/TNS.2021.3070643