MLC: a machine learning based checker for soft error detection in embedded processors
                                            author
                                    
                                    
                                            statement of authorship
                                    
                                    
Nosrati, Nooshin; Jenihhin, Maksim; Navabi, Zainalabedin
                                                    
                                            
                                            location of publication
                                    
                                    
New York
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
Code 183305
                                                    
                                            
                                            conference name, date
                                    
                                    
28th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, 2-14 Sept. 2022
                                                    
                                            
                                            conference location
                                    
                                    
Torino, Italy
                                                    
                                            
                                            ISBN
                                    
                                    
978-166547355-2
                                                    
                                            
                                            notes
                                    
                                    
Bibliogr.: 25 ref
                                                    
                                            
                                            TalTech department
                                    
                                    
                                
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                                    Nosrati, N., Jenihhin, M., Navabi, Z. MLC: a machine learning based checker for soft error detection in embedded processors // Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. New York : IEEE, 2022. Code 183305.