Kaevand, T., Kalda, J., Kukk, V., Öpik, A., Lille, Ü.

Correlation of the morphology and electrical conductivity in thin films of PEDT/PSS complex: an integrated meso-scale simulation study

author

Kaevand, Toomas

Kalda, Jaan

Kukk, Vello

Öpik, Andres

Lille, Ülo

statement of authorship

Toomas Kaevand, Jaan Kalda, Vello Kukk, Andres Öpik, Ülo Lille

source

Molecular simulation

journal volume number month

Vol. 37, 6

year of publication

2011

pages

p. 495-502 : ill

url

https://www.tandfonline.com/doi/abs/10.1080/08927022.2011.554549

subject term

õhukesed kiled

elektrijuhtivus

korrelatsioon (füüsika)

simulatsioon

morfoloogiline analüüs

keyword

conjugated poymer

meso-scale simulation

percolation

random resistor network

ISSN

0892-7022

notes

Bibliogr.: 24 ref

language

inglise

Kaevand, T., Kalda, J., Kukk, V., Öpik, A., Lille, Ü. Correlation of the morphology and electrical conductivity in thin films of PEDT/PSS complex: an integrated meso-scale simulation study // Molecular simulation (2011) Vol. 37, 6, p. 495-502 : ill. https://www.tandfonline.com/doi/abs/10.1080/08927022.2011.554549