Shibin, K., Jenihhin, M., Jutman, A., Devadze, S., Tsertov, A.

On-chip sensors data collection and analysis for SoC health management

author

Shibin, Konstantin

Jenihhin, Maksim

Jutman, Artur

Devadze, Sergei

Tsertov, Anton

statement of authorship

Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov

source

2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

publisher

IEEE

year of publication

2023

pages

6 p

conference name, date

36th IEEE InternationalSymposium on Defect andFault Tolerancein VLSIandNanotechnology Systems (DFT), 3-5 October 2023

conference location

Juan-les-Pins, France

url

https://doi.org/10.1109/DFT59622.2023.10313562

subject term

kiipvõrgud

rikked

veakindlus

algoritmid

keyword

SOC

modern system-on-chips (SoCs)

multi-processor system-on-chips (MPSoCs)

on-chip sensor

health management

fault management

health map

self-awareness

ISSN

2765-933X

ISBN

979-8-3503-1500-4

notes

Bibliogr.: 15 ref

scientific publication

teaduspublikatsioon

classifier

1.1

TTÜ department

arvutisüsteemide instituut

language

inglise

Shibin, K., Jenihhin, M., Jutman, A., Devadze, S., Tsertov, A. On-chip sensors data collection and analysis for SoC health management // 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). : IEEE, 2023. 6 p. https://doi.org/10.1109/DFT59622.2023.10313562