Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCs
statement of authorship
Hardi Selg, Konstantin Shibin, Anton Tsertov, Maksim Jenihhin, Peeter Ellervee, Jaan Raik
source
2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
location of publication
Los Alamitos, California
publisher
year of publication
conference name, date
37th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2024, 8-10 October 2024
conference location
Didcot
ISSN
2576-1501
ISBN
979-835036688-4
notes
Bibliogr.: 13 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
processor architecture
Scopus
classifier
Selg, H., Shibin, K., Tsertov, A., Jenihhin, M., Ellervee, P., Raik, J. Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCs // 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Los Alamitos, California : IEEE, 2024.