DSP-based electrical impedance tomography device: implementation and experiments
statement of authorship
Anar Abdullayev, Marek Rist, Margus Metshein, Olev Martens
source
2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
publisher
year of publication
pages
6 p
conference name, date
IEEE I2MTC – International Instrumentation and Measurement Technology Conference, 19-22 May 2025
conference location
Chemnitz, Germany
ISSN
2642-2069
ISBN
979-8-3315-0501-1
scientific publication
teaduspublikatsioon
TalTech department
language
English
subject term
keyword
classifier
Abdullayev, A., Rist, M., Metshein, M., Märtens, O. DSP-based electrical impedance tomography device: implementation and experiments // 2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC). : IEEE, 2025. 6 p.