Computer aided method for measurement of reflection and impedance characteristics of RF devices
author
Asovich, P.L.
Zhukov, S.A.
Ivanyuhin V.I.
statement of authorship
Asovich P.L., Zhukov S.A. and Ivanyuhin V.I
location of publication
Tallinn
year of publication
pages
p. 122-127: ill
subject term
notes
Bibl. 2 ref
review
Kokkuvõte: Kõrgsagedusseadiste impedantsi ja peegelduste automatiseeritud mõõtmismeetod
language
inglise
Asovich, P.L., Zhukov, S.A., Ivanyuhin V.I. Computer aided method for measurement of reflection and impedance characteristics of RF devices // Automation, simulation & measurement : ASM'91 : 3rd biennal conference, Tallinn, October 7-11, 1991. Section A. Section M / Tallinn Technical University. Tallinn, 1992. p. 122-127: ill.