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1
book article
Application specific true critical paths identification in sequential circuits
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
;
Devadze, Sergei
;
Oyeniran, Adeboye Stephen
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 299-304 : ill
https://doi.org/10.1109/IOLTS.2019.8854442
book article
2
book article
Determination of the mobility and bioavailability of heavy metals in soil by sequential extraction analysis
Hödrejärv, Helvi
;
Vaarmann, Aini
Euroanalysis IX : European Conference on Analytical Chemistry, Bologna (Italy), September 1-7, 1996 : [book of abstracts]
1996
/
p. Tu P 29
book article
3
book article
Hierarchical timing-critical paths analysis in sequential circuits
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
;
Devadze, Sergei
;
Kostin, Sergei
2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain
2018
/
6 p. : ill
https://doi.org/10.1109/PATMOS.2018.8464176
book article
4
book article
Multiple-objective backtrace for solving test generation constraints
Mekler, A.
;
Raik, Jaan
International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings
2003
/
p. 123-126 : ill
https://ieeexplore.ieee.org/document/1267732
book article
5
book article
RT-level test point insertion for sequential circuits
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
2004
/
p. 34-40 : ill
https://ieeexplore.ieee.org/document/1428412
book article
6
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
7
book article
Untestable fault identification in sequential circuits using model-checking
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 257-262 : ill
https://ieeexplore.ieee.org/document/4711554
book article
Number of records 7, displaying
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