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JTAG / boundary scan (keyword)
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1
book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
1 - 1
keyword
44
1.
JTAG / boundary scan
2.
boundary scan
3.
JTAG
4.
computed tomography scan
5.
line scan sensor
6.
multispectral-line scan-sensor
7.
reconfigurable scan networks
8.
reconfigurable scan-chain
9.
scan strategy
10.
scan-based stress
11.
synchrotron scan
12.
bottom boundary layer
13.
boundary conditions
14.
boundary conduction mode (BCM)
15.
boundary control
16.
boundary coupled distributed parameter systems
17.
Boundary element method
18.
boundary layer
19.
boundary layers
20.
boundary Mittag-Leffler stabilization
21.
Boundary object
22.
boundary objects
23.
boundary problem
24.
boundary properties
25.
boundary spanning
26.
boundary value problem
27.
boundary value problems
28.
essential boundary conditions at joints
29.
essential dynamic boundary conditions at joints
30.
free-boundary
31.
free-boundary reflection
32.
grain boundary
33.
Katian/Hirnantian boundary
34.
natural boundary conditions at joints
35.
Ordovician-Silurian boundary
36.
Ordovician–Silurian boundary
37.
Ordovician–Silurian boundary beds
38.
output feedback boundary stabilization
39.
Porkuni-Juuru boundary
40.
time-varying boundary conditions
41.
turbulent boundary layers
42.
twin boundary dynamics
43.
unknown boundary
44.
unknown boundary condition
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