Robson, Malcolm (author)

types of item

  • book article
    A BIST scheme for testing mixed analogue and digital circuitsRobson, Malcolm; Russel, GordonBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 183-186: ill
    book article
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