Balaišis, P. (author)

types of item

  • book article
    Systematic analysis of electronic devices reliabilityEidukas, D.; Balaišis, P.; Navikas, D.BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 255-258: ill
    book article
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