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Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005 (source)
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1
book article
An educational environment for digital testing : hardware, tools, and web-based runtime platform
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Vislogubov, Vladislav
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 412-419 : ill
https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf
book article
2
book article
Defect-oriented test- and layout-generation for standard-cell ASIC designs
Sudbrock, Joachim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 79-82 : ill
book article
3
book article
Improved fault emulation for synchronous sequential circuits
Raik, Jaan
;
Ellervee, Peeter
;
Tihhomirov, Valentin
;
Ubar, Raimund-Johannes
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 72-78 : ill
book article
4
book article
Power-constrained hybrid BIST test scheduling in an abort-on-first-fail test environment
He, Zhiyuan
;
Jervan, Gert
;
Peng, Zebo
;
Eles, Petru
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 83-86 : ill
book article
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