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Active power factor correction of diode rectifiers using output filters with diode-switched and harmonic-resonant stages [Electronic resource]Sakkos, Tiiu; Sarv, Vello8th European Conference on Power Electronics and Applications : EPE'99 : 7-9 September, EPFL Lausanne, Switzerland1999 / [10] p. : ill [CD-ROM]

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Blood flow detection with diode laserMeigas, Kalju; Hinrikus, Hiie; Kattai, Rain; Lass, JaanusMedical physics2000 / 6, [CD-ROM], Digest of Papers of the 2000 World Congress on Medical Physics and Biomedical Engineering and [...] : Chicago 2000 : July 23-28, 2000, Chicago's Navy Pier, [3] p. : ill

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Characterization of the throughput beam of a ten-photodiode transmission trapdetectorKübarsepp, Toomas; White, MalcolmMetrologia2011 / p. 359-364 : ill https://iopscience.iop.org/article/10.1088/0026-1394/48/5/017/meta

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Comparison of Si and SiC devices surge current capability by means of numerical simulationsVelmre, Enn; Udal, AndresBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 77-80: ill

Degragation of 600-V 4H-SiC Schottky diodes under irradation with 0,9 MeV electronsLebedev, Alexander A.; Davydovskaja, K. S.; Kozlovski, Vitali V.; Korolkov, Oleg; Sleptšuk, Natalja; Toompuu, Jana11th European Conference on Silicon Carbide and Related Materials : September 25-29, 2016, Porto Carras Grand Resort, Halkidiki, Greece : [poster session]2016 / p. 49

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Fault diagnosis of output-side diode-bridge in isolated DC-DC series resonant converterBakeer, Abualkasim Ahmed Ali; Chub, Andrii; Vinnikov, Dmitri2022 IEEE 7th International Energy Conference (ENERGYCON)2022 https://doi.org/10.1109/ENERGYCON53164.2022.9830339

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Investigation of charge carrier lifetime temperature-dependence in 4H-SiC diodesVelmre, Enn; Udal, AndresSilicon carbide and related materials 20062007 / p. 375-378 https://www.researchgate.net/publication/250348987_Investigation_of_Charge_Carrier_Lifetime_Temperature-Dependence_in_4H-SiC_Diodes

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Investigation of silicon carbide diode structures via numerical simulations including anisotropic effectsVelmre, Enn; Udal, Andres; Masszi, F.; Nordlander, E.Simulation of semiconductor devices and processes. Vol. 61995 / p. 340-343: ill https://link.springer.com/chapter/10.1007/978-3-7091-6619-2_83

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New active diode-switched transformer filters to improve power factor of three-phase diode rectifiers with capacitive smoothingSakkos, Tiiu; Sarv, VelloProceedings of the Estonian Academy of Sciences. Engineering1997 / 3, p. 158-170: ill

A new low-distorting three-phase diode rectifier employing optimum ripple power control [Electronic resource]Sakkos, Tiiu; Sarv, VelloProceedings of 4th International Workshop CPE 2005 : Compatibility in Power Electronics : Fifth International Research and Educational Colloquium on Electronics : 1-3 June 2005, Gdynia, Poland2005 / [6] p. : ill. [CD-ROM] https://www.researchgate.net/publication/4196868_A_new_low-distorting_three-phase_diode_rectifier_employing_optimum_ripple_power_control

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Numerical simulation of a silicon carbide diodeVelmre, Enn; Udal, AndresBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 21994 / p. 559-566: ill https://www.ester.ee/record=b2150914*est

Numerical simulations for reverse recovery process investigations of LPE GaAs power diodesKoel, Ants; Rang, Toomas; Voitovitš, Viktor; Toompuu, JanaBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 39-42 : ill

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Optical Self-mixing in a diode laser as a method for no touch pulse measurementMeigas, Kalju; Hinrikus, Hiie; Lass, Jaanus; Kattai, RainVIII Mediterranean Conference on Medical and Biological Engineering and Computing : Medicon'98, June 14-17, 1998, Lemesos, Cyprus : final programme and abstracts of papers1998 / p. 184

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Power factor correction of three-phase diode rectifiers using optimum ripple-power controlSakkos, Tiiu; Sarv, VelloEPE-PEMC 2004 : 11th International Power Electronics and Motion Control Conference : 2-4 September 2004, Riga, Latvia : proceedings. Vol.5 of 7, Power supply quality, renewables, power systems and DER2004 / p. 5-397 - 5-401 : ill

Power factor correction on three-phase diode rectifiers using ripple-power re-rectification and resonant filtersJärvik, Jaan; Sakkos, Tiiu; Sarv, Vello48. Internationales Wissenschaftliches Kolloquium, 22.-25.09.2003, Technische Universität Ilmenau, Germany2003 / p. 595-596 : ill

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Predictable quantum efficient detector II : characterization resultsMüller, Ingmar; Brida, G.; Kübarsepp, ToomasProceedings of NEWRAD : [Maui, Hawaii, 18-23 September 2011]2011 / p. 209-210 : ill

Predictable quantum efficient detector. II, Characterization and confirmed responsivityMüller, Ingmar; Johannsen, Uwe; Linke, Ulrike; Socaciu-Siebert, Liana; Smid, Marek; Porrovecchio, Geiland; Sildoja, Meelis; Manoocheri, Farshid; Ikonen, Erkki; Gran, Jarle; Kübarsepp, Toomas; Brida, Giorgio; Werner, LutzMetrologia2013 / p. 395-401 : ill https://doi.org/10.1088/0026-1394/50/4/395 https://www.scilit.com/publications/aacc372397c67cffa0451e026894282f Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

Progress in development of the resonant tunneling diodes as promising compact sources at the THz gap bottomUdal, Andres; Jaanus, Martin; Valušis, Gintaras; Kašalynas, Irmantas; Ikonic, Zoran; Indjin, DraganTHz for CBRN and explosives detection and diagnosis ;2017 / p. 169-178 https://doi.org/10.1007/978-94-024-1093-8_20 Article collection metrics at Scopus Article at Scopus Article at WOS

Pulse profile registration using self-mixing in diode laserMeigas, Kalju; Hinrikus, Hiie; Lass, Jaanus; Kattai, RainProceedings of the 20th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Vol. 20, no. 4, Biomedical Engineering Towards the Year 2000 and Beyond : Hong Kong SAR, China, October 29-November 1, 19981998 / p. 1875-1878 : ill

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О старении электролюминесцентных диодовValdna, Vello; Varvas, JüriПолупроводниковые материалы. 21972 / с. 113-116 : илл https://www.ester.ee/record=b1476073*est https://digikogu.taltech.ee/et/Item/75bd57ba-4543-4614-ab7c-3230cb13e005

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