Comprehensive performance and robustness analysis of 2D turn models for network-on-chipsAzad, Siavoosh Payandeh; Niazmand, Behrad; Janson, Karl; Kogge, Thilo; Raik, Jaan; Jervan, Gert; Hollstein, Thomas2017 IEEE International Symposium on Circuits and Systems (ISCAS)2017 / p. 1476-1479 : ill https://doi.org/10.1109/ISCAS.2017.8050634 Conference proceedings at Scopus Article at Scopus Article at WOS