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Numerical simulation of electrothermal effects in ESD protection devicesHellstrom, S.; Freidin, Boris; Velmre, Enn; Udal, AndresTechn. Dig. of the 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 1992, Oct. 5-8, Schwabisch Gmünd, Germany1992

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