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HDL-s for students with different backgroundReinsalu, Uljana; Arhipov, Anton; Evartson, Teet; Ellervee, PeeterProceedings MSE 2007 : 2007 IEEE International Conference on Microelectronic Systems Education : 3-4 June 2007, San Diego, CA2007 / p. 69-70 https://ieeexplore.ieee.org/document/4231454

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IMMizer : an innovative cost-effective method for minimizing assertion setsHeidari Iman, Mohammad Reza; Raik, Jaan; Jervan, Gert; Ghasempouri, Tara2022 25th Euromicro Conference on Digital System Design (DSD) : Maspalomas, Spain 2022 : proceedings2022 / p. 671 - 678 https://doi.org/10.1109/DSD57027.2022.00095 Article at Scopus Article at WOS

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Implementation of sorting algorithms in reconfigurable hardwareSkliarova, Iouliia; Sklyarov, Valery; Mihhailov, Dmitri; Sudnitsõn, Aleksander2012 IEEE Mediterranean Electrotechnical Conference (MELECON 2012) : Yasmine Hammamet, Tunisia, March 25-28, 20122012 / p. 107-110 : ill https://ieeexplore.ieee.org/document/6196391

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An improved implementation of shift displacement method on hardware —comprehensive evaluation of emerging bi-pedal techniquesAbideen, Zain Ul; Tariq, Hassan; Hafeez, Muhammad Asfand; Subhani, Zahid Mehmood2020 4th International Conference on Automation, Control and Robots : Rome, Italy, 11-13 October 20202020 / p. 7-12 : ill https://doi.org/10.1109/ICACR51161.2020.9265496

Infotehnoloogia. Sõnastik. Osa 3, AparatuuritehnikaHanson, Vello; Agur, Ustus; Kalja, Ahto; Võhandu, Leo1999 https://www.ester.ee/record=b1708557*est

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Introduction to the IOT (Internet of Things) : coursebookSell, Raivo; Puks, Rim; Kingsepp, Mallor; Nikitenko, Agris; Berkolds, Karlis; Vagale, Anete; Rumba, Rudolfs; Czekalski, Piotr; Tokarz, Krzysztof; Läll, Karl2025 https://ebooks.rtu.lv/product/introduction-to-the-iot-second-edition/?lang=en#tab-id-1

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Latest trends in hardware security and privacyDi Natale, Giorgio; Regazzoni, Francesco; Albanese, Vincent; Lhermet, Frank; Loisel, Yann; Sensaoui, Abderrahmane; Pagliarini, Samuel Nascimento33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : ESA-ESRIN, Italy (On-line Virtual Event),October 19–21, 20202020 / 4 p. : ill https://doi.org/10.1109/DFT50435.2020.9250816

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Microprocessors and microsystems : MICPRO : embedded hardware design2010

Mikrokontrollerite M68HC11 ja Satt Con 05 riist- ja tarkvara : metoodiline materjalTammemäe, Kalle; Toomsalu, Arvo1995 https://www.ester.ee/record=b1069449*est

Mikrokontrollerite riistvara turbestToomsalu, ArvoArvutustehnika ja Andmetöötlus1997 / 7/8, lk. 7-12

Miniatuurne märgvara [Võrguteavik]Tammemäe, KalleArvutimaailm2018 / 14 p https://www.am.ee/margvara

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Modular approach to training hardware design for modular teaching [Electronic resource]Galkin, Ilja; Laugis, JuhanEPE-PEMC 2006 : 12th International Power Electronics and Motion Control Conference : Portorož, Slovenia, August 30 - September 1, 2006 : proceedings2006 / p. 1715-1720 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4778652

Moore'i seadus ja tehnoloogia arengToomsalu, ArvoArvutustehnika ja Andmetöötlus1997 / 9, lk. 3-10

Multimeedia ülekanne piiratud ressursside puhulKulmar, MarikaTelekommunikatsioon 2002 : IX rahvusvahelise telekommunikatsioonipäeva materjalid2002 / lk. 36-45 : ill

Multimeediumisüsteemide riistvaraToomsalu, ArvoArvutustehnika ja Andmetöötlus1997 / 10, lk. 7-16

Mutation analysis for systemC designs at TLMGuarnieri, Valerio; Bombieri, Nicola; Pravadelli, Graziano; Fummi, Franco; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 20112011 / [6] p https://ieeexplore.ieee.org/document/5985925

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NATO kursus riist- ja tarkvara koosdisainistTammemäe, KalleArvutustehnika ja Andmetöötlus1995 / 9, lk. 23-24; 10, lk. 2-8; 11, lk. 2-7; 12, lk. 8-15

NeuroPIM: felxible neural accelerator for processing-in-memory architecturesBidgoli, Ali Monavari; Fattahi, Sepideh; Rezaei, Seyyed Hossein Seyyedaghaei; Modarressi, Mehdi; Daneshtalab, Masoud2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) : May 3-5, 2023, Tallin, Estonia : proceedings2023 / p. 51-56 https://doi.org/10.1109/DDECS57882.2023.10139567

New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

Novel architectures for contractive autoencoders with embedded learningKerner, Madis; Tammemäe, Kalle; Raik, Jaan; Hollstein, Thomas2020 17th Biennial Baltic electronics conference, Tallinn, Estonia, October 6-8, 2020 : proceedings2020 / 6 p. : ill https://doi.org/10.1109/BEC49624.2020.9277246

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On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill https://link.springer.com/article/10.1007/s10836-012-5303-6

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Ontology design for automatic evaluation of web user interface usability [Electronic resource]Robal, Tarmo; Marenkov, Jevgeni; Kalja, AhtoPICMET '17 : Portland International Conference on Management of Engineering and Technology : Technology Management for the Interconnected World : proceedings2017 / p. 1-8 : ill. [USB] https://doi.org/10.23919/PICMET.2017.8125425

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PASCAL : timing SCA resistant design and verification flowLai, Xinhui; Jenihhin, Maksim; Raik, Jaan; Paul, Kolin2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 239-242 : ill https://doi.org/10.1109/IOLTS.2019.8854458

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PrefaceBellatreche, Ladjel; Chernishev, George; Corral, Antonio; Ouchani, Samir; Vain, JüriAdvances in Model and Data Engineering in the Digitalization Era : MEDI 2021 International Workshops : DETECT, SIAS, CSMML, BIOC, HEDA, Tallinn, Estonia, June 21–23, 2021 : proceedings2021 / p. v-vii https://link.springer.com/content/pdf/bfm:978-3-030-87657-9/1?pdf=chapter%20toc Article collection metrics at Scopus Article at Scopus

PrefaceAttiogbe, Christian; Ben Yahia, SadokModel and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings2021 / p. v-vi https://doi.org/10.1007/978-3-030-78428-7 Conference proceeding at Scopus Article at Scopus

PrefaceHollstein, Thomas; Raik, Jaan; Kostin, Sergei; Tšertov, Anton; O’Connor, Ian; Reis, RicardoVLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability, 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016 : Revised Selected Papers2017 / p. V-VI https://link.springer.com/book/10.1007/978-3-319-67104-8 Conference proceedings at Scopus Article at Scopus

Processing N-ary trees in hardware circuitsSklyarov, Valery; Skliarova, Iouliia; Mihhailov, Dmitri; Sudnitsõn, Aleksander13th International Symposium on Integrated Circuits (ISIC) : Singapore, 12-14 December 2011 : proceedings2011 / p. 262-265 : ill https://ieeexplore.ieee.org/document/6131946

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Processing tree-like data structures in different computing platformsSklyarov, Valery; Skliarova, Iouliia; Oliveira, Ramiro; Mihhailov, Dmitri; Sudnitsõn, Aleksander2011 International Conference on Information and Computer Applications (ICICA 2011) : Dubai, United Arab Emirates, March 18-20, 20112011 / p. 112-116 : ill https://sweet.ua.pt/iouliia/Papers/2011/rp025_ICICA2011-A067.pdf

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PV-battery assisted three-level T-Type inverter for AC residential nanogrid realized with small-scale HIL unitsGutierrez-Escalona, Javier; Roncero-Clemente, Carlos; Gonzalez-Romera, Eva; Milanes-Montero, Maria Isabel; Husev, Oleksandr; Romero-Cadaval, EnriqueIEEE Access2023 / p. 48007 - 48021 https://doi.org/10.1109/ACCESS.2023.3276235 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPGPalermo, N.; Tihhomirov, Valentin; Copetti, Thiago; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 20152015 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2015.7102405

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

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