Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590