Side-channel attacks on triple modular redundancy schemesAlmeida, Felipe; Aksoy, Levent; Raik, Jaan; Pagliarini, Samuel Nascimento2021 IEEE 30th Asian Test Symposium ATS 2021 : proceedings2021 / p. 79-84 : ill https://doi.org/10.1109/ATS52891.2021.00026 Conference Proceedings at Scopus Article at Scopus Article at WOS