Reliability study of input side capacitors in impedance-source PV microconvertersLiivik, Elizaveta; Vinnikov, Dmitri; Chub, Andrii; Shen, YanfengIECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : proceedings2019 / p. 5026–5032 : ill https://doi.org/10.1109/IECON.2019.8927173 Conference proceedings at Scopus Article at Scopus Article at WOS