Determination of modulus of elasticity, nanohardness and residual stresses in brush-plated gold and silver coatings on copper substrateLille, Harri; Kõo, Jakub; Rjabtšikov, Aleksander; Veinthal, Renno; Mikli, Valdek; Sergejev, FjodorMaterials science = Medžiagotyra2012 / p. 51-56 : ill https://www.researchgate.net/publication/266348938_Determination_of_Modulus_of_Elasticity_Nanohardness_and_Residual_Stresses_in_Brush-plated_Gold_and_Silver_Coatings_on_Copper_Substrate

Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface propertiesKropman, Daniel; Mellikov, Enn; Kärner, Tiit; Heinmaa, Ivo; Laas, Tõnu; Londos, Charalampos; Misiuk, AndrzejSolid state phenomena2011 / p. 263-266 https://www.sciencedirect.com/science/article/pii/S0040609009014564

Investigation of residual stresses and some elastic properties of brush-plated gold and silver galvanic coatingsLille, Harri; Kõo, Jakub; Rjabtšikov, Aleksander; Reitsnik, Renno; Veinthal, Renno; Mikli, Valdek; Sergejev, FjodorEngineering materials and tribology2013 / p. 125-130 : ill

Stress relaxation mechanism by strain in the Si-SiO2 system and its influence on the interface propertiesKropman, Daniel; Mellikov, Enn; Kärner, Tiit; Laas, Tõnu; Medvid, Arthur; Onufrijevs, Pavels; Dauksta, EdvinsSolid state phenomena2011 / p. 259-262 https://globaljournals.org/GJSFR_Volume17/1-Stresses-Relaxation-Mechanism.pdf

Stress relaxation mechanism by strain in the Si-SiO2 system and its influence on the interface propertiesKropman, Daniel; Seeman, Viktor; Dolgov, Sergei; Heinmaa, Ivo; Medvid, ArturPhysica Status Solidi (C) Current Topics in Solid State Physics2016 / p. 790 - 792 https://doi.org/10.1002/pssc.201600051 Journal metrics at Scopus Article at Scopus Article at WOS

Understanding and control of stress at Si-SiO2 interfaceKropman, Daniel; Seeman, Viktor; Medvids, Arturs; Onufrijevs, Pavels; Vitusevich, Svetlana; Mikli, ValdekKey engineering materials2020 / p. 291−296 https://doi.org/10.4028/www.scientific.net/KEM.850.291 Journal metrics at Scopus Article at Scopus