Systematic unsupervised recycled field-programmable gate array detectionIsaka, Yuya; Shintani, Michihiro; Ahmed, Foisal; Inoue, MichikoIEEE transactions on device and materials reliability2022 / 10 p. : ill https://doi.org/10.1109/TDMR.2022.3164788 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS