Reliability of electroencephalogram-based individual markers - case studyUudeberg, Tuuli; Päeske, Laura; Hinrikus, Hiie; Lass, Jaanus; Bachmann, Maie2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)2020 / p. 276 - 279 https://doi.org/10.1109/EMBC44109.2020.9175274 Conference Proceedings at Scopus Article at Scopus Article at WOS