Rejuvenation of NBTI-impacted processors using evolutionary generation of assembler programsPellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; Sonza Reorda, Matteo; Tihhomirov, Valentin; Ubar, Raimund-Johannes2016 IEEE 25th Asian Test Symposium : 21-24 November 2016, Hiroshima, Japan2016 / p. 304-309 : ill https://doi.org/10.1109/ATS.2016.57 Conference Proceedings at Scopus Article at Scopus Article at WOS