DTRON : a tool for distributed model-based testing of time critical applicationsAnier, Aivo; Vain, Jüri; Tsiopoulos, LeonidasProceedings of the Estonian Academy of Sciences2017 / p. 75-88 : ill https://doi.org/10.3176/proc.2017.1.08 http://www.ester.ee/record=b2355998*est Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS