Keynote: cost-efficient reliability for Edge-AI chipsJenihhin, Maksim; Taheri, Mahdi; Cherezova, Natalia; Ahmadilivani, Mohammad Hasan; Selg, Hardi; Jutman, Artur; Shibin, Konstantin; Tsertov, Anton; Devadze, Sergei; Kodamanchili, Rama Mounika; Rafiq, Ahsan; Raik, Jaan; Daneshtalab, Masoud2024 IEEE 25th Latin American Test Symposium (LATS)2024 / 2 p https://doi.org/10.1109/LATS62223.2024.10534610 Article at Scopus