Effective scalable IEEE 1687 instrumentation network for fault managementJutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE design & test2013 / p. 26-35 : ill https://doi.org/10.1109/MDAT.2013.2278535 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS