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Achieving accuracy in charge carrier mobility modelling in siliconMnatsakanov, T.T.; Gresserov, B.N.; Pomortseva, L.I.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 89-94: ill https://www.ester.ee/record=b1064031*est

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CAD in the education of microelectronics at the Technical University of BudapestSzekely, V.; Tarnay, K.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 146-151 https://www.ester.ee/record=b1064031*est

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CAD of CCD VLSIZaycev, S.N.; Kanunnikov, A.I.; Pugachev, A.A.; Shilin, V.A.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 120-122: ill https://www.ester.ee/record=b1064031*est

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Class-E inverter: SPICE simulation including parasitic elementsLiberatore, A.; Manetti, S.; Piccirilli, Maria Cristina; Reatti, A.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 69-75: ill https://www.ester.ee/record=b1064031*est

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Complex simulation of punchthrough, tunneling and high-speed characteristics of scaled bipolar devices and circuitsBubennikov, Alexander N.; Ishevsky, D.V.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 26-31: ill https://www.ester.ee/record=b1064031*est

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Computation of MOS transistor channel currents using Gear methods in SPICECremascoli, Paolo; Gubian, Paolo; Zanella, MarinaAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 59-68: ill https://www.ester.ee/record=b1064031*est

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Computational methods for semiconductor device simulation using adaptive composite gridsBoglaev, I.P.; Sirotkin, V.V.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 76-82: ill https://www.ester.ee/record=b1064031*est

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Computer-aided analysis of the GTO thyristor current squeezing effectVelmre, Enn; Udal, AndresAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 159-171: ill https://www.ester.ee/record=b1064031*est

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Determination of transistor low freqency noise parameters for SPICE programmeZeltinš, M.; Slaidinš, I.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 127-131: ill https://www.ester.ee/record=b1064031*est

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The effective calculate scheme of the conjugate gradient methodMulyarchick, S.G.; Belyavsky, S.S.; Popov, A.V.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 47-52: ill https://www.ester.ee/record=b1064031*est

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Estonian electronic industryRang, ToomasAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 4-10: ill https://www.ester.ee/record=b1064031*est

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Generalization of longitudinal-lateral scheme for two-dimensional transient semiconductor device simulationGunko, V.B.; Kucherenko, S.S.; Kudryashov, N.A.; Sytsko, Yu.I.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 107-112: ill https://www.ester.ee/record=b1064031*est

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The investigation of distributed non-quasi-static high-current-density effects in advanced transistorsBubennikov, Alexander; Kargashin, A.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 32-40: ill https://www.ester.ee/record=b1064031*est

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ISTOC-2D: system of mixed device-circuit modeling for personal computerPhilatov, N.I.; Nakropin, B.O.; Yakovlev, D.G.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 95-100: ill https://www.ester.ee/record=b1064031*est

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Model reduction in VLSI circuit designRogoza, V.S.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 113-119: ill https://www.ester.ee/record=b1064031*est

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Nonisothermal numerical simulation of semiconductor power devicesVelmre, Enn; Udal, AndresAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 139-145: ill https://www.ester.ee/record=b1064031*est

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Numerical calculations of transient characteristics of a vertical field effect phototransistor taking into account resistance on the gateAbashkina, S.; Rimshans, J.; Korolkov, V.I.; Tabarov, T.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 83-88: ill https://www.ester.ee/record=b1064031*est

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Numerical scaling and speed-pover-optimization of polysilicon transistors & circuitsBubennikov, AlexanderAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 41-46: ill https://www.ester.ee/record=b1064031*est

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Numerical simulation of photoelectric processes in semiconductor devicesKucherenko, S.S.; Kudryashov, N.A.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 101-106: ill https://www.ester.ee/record=b1064031*est

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A power fast reverse turn-on diode thyristor ТБР143Graujnis, V.; Kovrov, A.; Kuzmin, V.; Hanstin, R.; Toomla, O.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 132-138: ill https://www.ester.ee/record=b1064031*est

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The program for solving the scalar potential by using finite element method for IBM PCDmytryshyn, O.; Tchaban, V.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 53-58: ill https://www.ester.ee/record=b1064031*est

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Simulation of charge transfer in CCDs for low temperature applicationsZaycev, S.N.; Zinis, K.A.; Chernokogin, V.V.; Shilin, V.A.Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / p. 123-126 https://www.ester.ee/record=b1064031*est

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Überblick der Situation in der Deutschen Elektronik- und InformatikindustrieRang, ToomasAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / S. 11-25: Ill https://www.ester.ee/record=b1064031*est

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Обобщенные формулы для анализа лавинного умножения носителей заряда в pn-переходахVelmre, EnnAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / с. 172-183: ил https://www.ester.ee/record=b1064031*est

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Расчет и оптимизация параметров запираемых тиристоров с учетом внешней цепиКуузик Э.И.; Кыверик К.Х.; Свирин А.В.; Udal, AndresAutomation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool1992 / с. 184-199: ил https://www.ester.ee/record=b1064031*est

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Automation, simulation & measurement : 3rd biennal conference : Tallinn, Estonia, October 7-11, 1991. Section S, Simulation = Automatiseerimine, modelleerimine ja mõõtmine : 3. rahvusvaheline konverents / Tallinna Tehnikaülikool (source)

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