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Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005 (source)
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book article
Efficient at-speed interconnect BIST and diagnosis framework
Jutman, Artur
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. 257-258 : ill
https://artiklid.elnet.ee/record=b1018804*est
book article
2
book article
Evolutionary approach to test generation for functional BIST
Skobtsov, Y.A.
;
Ivanov, D.E.
;
Skobtsov, V.Y.
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. 151-155 : ill
https://artiklid.elnet.ee/record=b1018764*est
book article
3
book article
Foreword
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Al-Hashimi, Bashir
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
2005
/
p. III
book article
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European Test Symposium (ETS)
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