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DDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings (source)
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book article
Generic interconnect BIST for Network-on-Chip
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Raik, Jaan
DDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings
2005
/
p. 224-227 : ill
book article
2
book article
An improved estimation technique for hybrid BIST test set generation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
DDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings
2005
/
p. 182-185 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/ddecs05.pdf
book article
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