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Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010 (source)
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book article
An approach for PSL assertion coverage analysis with high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
2010
/
p. 13-16 : ill
https://ieeexplore.ieee.org/document/5742048
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2
book article
Testing beyond the SoCs in a lego style
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
2010
/
p. 334-338 : ill
book article
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