• At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]Gorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, Mart31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers2013 / p. 1-6 : ill [USB]
• Combinational fault simulation in sequential circuitsUbar, Raimund-Johannes; Kõusaar, Jaak; Gorev, Maksim; Devadze, Sergei2015 IEEE International Symposium on Circuits and Systems : 24-27 May 2015, Lisboa, Portugal : [proceedings]2015 / p. 2876-2879 : ill https://doi.org/10.1109/ISCAS.2015.7169287 https://www.scopus.com/sourceid/56190 https://www.scopus.com/record/display.uri?eid=2-s2.0-84946223399&origin=inward&txGid=6955ad8431487055d89ab5316f7fd94c https://www.webofscience.com/wos/woscc/full-record/WOS:000371471003040
• Comparison of two approaches to improve functional BIST fault coverageKostin, Sergei; Ubar, Raimund-Johannes; Gorev, Maksim; Mägi, GunnarBEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia2014 / p. 105-108 : ill
• Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est https://doi.org/10.3176/proc.2014.2.05 https://www.scopus.com/sourceid/11500153303 https://www.scopus.com/record/display.uri?eid=2-s2.0-84901271126&origin=inward&txGid=e3907784fac471e93f7e99c9aa202122 https://jcr.clarivate.com/jcr-jp/journal-profile?journal=P%20EST%20ACAD%20SCI&year=2014 https://www.webofscience.com/wos/woscc/full-record/WOS:000337664000005
• Functional self-test of high-performance pipe-lined signal processing architecturesGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, Peeter; Devadze, Sergei; Raik, Jaan; Min, MartMicroprocessors and microsystems2015 / p. 909-918 : ill https://doi.org/10.1016/j.micpro.2014.11.002 https://www.scopus.com/sourceid/15552 https://www.scopus.com/record/display.uri?eid=2-s2.0-84949774970&origin=inward&txGid=4e28bda483324ecfb9e44b95432f733b https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2015 https://www.webofscience.com/wos/woscc/full-record/WOS:000366879500030
• Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880
• Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill